- PXI SMU/Power Supply Instrument
- PXI Semiconductor/IC Test System
- General PXI Instrument
- PXI OLED Test System
OLED Lifetime Test System Model 58131
- Individual PMU for each UUT
- Precision sourcing of current/voltage per UUT
- Precision measurement unit per UUT
- Single UUT failure is self contained, will not interrupt or corrupt other UUT testing
- Test Function
- Electrical Characteristics
- Programmable driving waveform (Bipolar current/voltage)
- Automatic testing and data logging
- Standard Test System
- PXI Chassis with Controller
- Modular OLED test cards (one for every two OLED panels)
- Maximum 34 UUTs/system
- Optional Components
- Spectrometer unit for in depth optical characterization
- Turnkey test solution
- Flexible test fixtures (Accept different OLED panel sizes)
- Half rack with sliding drawers (4 fixtures per drawer)
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity.
Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
58131 is based on PXI, the state of the art open platform for modular instrumentation. Spectrometer modules can be added for in depth optical characterization. As a matter of fact, other PXI instrument cards can be added to make the system extremely versatile and flexible.
58131 comes with a simple to use windowing graphical interface. Configuration of stimulus voltage, current, duty cycle, calibration, and test intervals can be changed easily. Adjustable measurement frequency at different time intervals allows rapid sampling at initial stages and lengthened measurement period later on. Report generation, including graphical data presentation is available to facilitate data analysis. 58131 software is comprehensive enough for R&D in depth characterization, yet simple enough for production on-going reliability test operation.
58131 is housed in a half height 19" rack with drawers for UUT placement. Each drawer contains several fixtures. Ingenious fixture design accommodates UUT of different sizes and allows quick placement and extraction of OLED panels. Display monitor and keyboard are placed on top of the rack. With an 18-slot chassis, up to 34 UUTs can be tested simultaneously.
58131 OLED Lifetime Test System offers good test capacity in a very small footprint, isolated PMU for each panel, and comprehensive software with a friendly user interface. Without a doubt, it is the best OLED test solution in the market.
Hardware li>8/14/18-slot PXI Chassis li>52941 533MHz/52942 800MHz Embedded li>PC Controller li>52951 Two-Quadrant Source-Measure Card li>Optional 19" Rack li>Optional 15" LCD Monitor li>Optional Mouse and keyboard
The test system provides a WindowsTM interface for easy configuration of all electrical & optical tests. Each test comprises: li>Multiple stimulus configuration li>Real time test data presentation in tabular and li>graphical forms li>Up to 34 UUTs li>Brightness calibration li>Automatic test termination when brightness test limit is reached
Customized Test Fixture li>19" Rack Mount configuration li>Up to 34 test fixtures in drawers li>Flexible fixture design allows for different li>OLED panel sizes
Independent calibration data for each channel