Advanced SoC/Analog Test System - Model 3680

Key Features

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SoC/Analog Test System - Model 3650-EX

Key Features

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SoC/Analog Test System - Model 3650

 Key Features

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SoC/Analog Test System - Model 3650-CX

Key Features
  • 50 / 100MHz; 200Mhz (MUX) Clock Rate
  • 50 / 100Mbps; 200 Mbps (MUX) Data Rate
  • Up to 256 digital I/O pins
  • 16/32 (option) MW vector memory
  • 16/32 (option) MW pattern instruction memory
  • Per-pin timing/PPMU/frequency measurement
  • Up to 4-32 16-bit ADDA channels option
  • SW configurable scan chains in 1024M depth or up to 32 scan chains/board
  • ALPG option for memory test
  • Up to 16 high-voltage pins
  • 16 high-performance DPS channels
  • Overall timing accuracy < ±550ps
  • 8 ~ 32-CH / board for VI45 analog option
  • 2 ~ 8-CH / board for PVI100 analog option
  • Microsoft Windows® XP OS
  • C++ and GUI programming interface
  • CRISP, full suite of intuitive software tools
  • Air-cooled, All-in-one design and space-saving footprint
  • Cable mount / Direct mount

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Programmable Pin Electronics Module - Model 36010

Key Features

APPLICATIONS

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DUT Power Supply - Model 36020

Key Features

APPLICATIONS

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VLSI Test System - Model 3380

Key Features

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VLSI Test System - Model 3380-P

Key Features

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VLSI Test System - Model 3380-D

Key Features

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VLSI Test System - Model 3360-D

Key Features

VLSI Test System - Model 3360-P

Key Features

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VLSI Test System - Model 3360

Key Features

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High Speed PXIe Digital IO Card - Model 33010

Key Features

Applications

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Hybrid Single Site Test Handler - Model 3110

Key Features

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Full Range Active Thermal Control Handler - Model 3110-FT

Key Features

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Tabletop Single Site Test Handler - Model 3111

Key Features

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Die Test Handler - Model 3112

Key Features

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(Fingerprint) Quad Site Final Test Handler - Model 3160 series

Key Features

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Tri-Temp Quad Sites Handler - Model 3160C

Key Features

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Octal Site Test Handler - Model 3180

Key Features

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Automatic System Function Tester - Model 3240

Key Features

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RF Solution Integrated Handler - Model 3240-Q

Key Features

Automatic System Function Tester - Model 3260

Key Features

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Miniature IC Handler - Model 3270

Key Features

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Test-In-Tray Handler - Model 3280

Key Features

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Touch Panel Multi-Sites Test Handler - Model 3813

Key Features

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Wafer Inspection System - Model 7935

Key Features

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