XGT-7200 X-ray Analytical Microscope

 

Overview

The XGT-7200 represents a completely new generation of XRF microscope, and leads the way to a new era of science. It offers a seamless merger between optical observation and elemental analysis functions, revolutionizing the world of micro-analysis and establishing micro-XRF as a routine tool for the research and analytical scientist.

Unique hardware features ensure the system offers versatility and flexibility for every measurement. A choice of two software controlled x-ray guide tubes with diameters ranging from a unique 10 µm through to 1.2 mm allow conditions to be optimised for a range of measurements, including both micro and macro. Similarly, with the unique Dual Vacuum Modes it is possible to switch within seconds between a high sensitivity full vacuum mode and a versatile localised vacuum mode. The latter maintains samples at atmospheric pressure whilst retaining sensitivity to all elements from sodium to uranium.

In any configuration the intelligent combination of optical cameras ensure that the precise analysis position can be quickly and simply located.

Single Point and Multi-point Analysis

Single point and Multi-point AnalysisSingle point and automated multi-point analyses allow high quality spectra to be acquired from either a single position, or from a number of user defined points across the sample. Element peaks are automatically located and labelled, and quantitative analysis down to ppm levels can be carried out using the fundamental parameters method (FPM), FPM with single standard, and full standard sample calibration.Thickness calculations can also be made on nm and µm thick multi-layered structures.

Hyperspectral Mapping Analysis

Hyperspectral Mapping AnalysisThe SmartMap imaging software records a full EDXRF spectrum at each and every pixel of the element image, enabling post-acquisition element image generation and comparison, and spectrum generation from user defined regions in the image with subsequent qualitative and quantitative characterisation.

Transmitted X-ray imaging provides additional insight into a sample’s structure, allowing features invisible by eye to become immediately apparent.

Features

The unique features of the XGT-7200 have seen this innovative micro-XRF analyser widely embraced for a range of applications, including electronics, engine wear analysis, forensic science, geology, mineralogy, pharmaceutics, museums, metallurgy, biology, medicine and archaeology.

The flexible XGT-7200 micro-XRF system covers everything from macro analysis, for a general survey of a wide area, to the inspection of a specific micro area, with simultaneous XRF and transmission imaging. Its many features ensure high performance analysis with easy operation.

  • Highest spatial resolution

    Highest spatial resolutionThe unique x-ray guide tube technology of HORIBA provides the highest spatial resolution micro-XRF analysis, with x-ray beam diameters down to 10 µm. The high intensity, ultra-narrow beams provided by the guide tubes allow fast, non-destructive analysis of microscopic features.
  • Transmission X-ray Mapped Imaging 

    Transmission X-ray Mapped ImagingIn combination with XRF imaging, the XGT-7200 allows transmitted X-ray images to be acquired. This can be used to perform internal structural analyses and identify regions of interest not visible to the eye. Scanning is done with a narrow perpendicular beam, resulting in clear penetrating images even for non-flat samples such as cylindrical parts.
  • Dual Vacuum Modes

    Dual Vacuum ModesThe XGT-7200 system offers the user unique Dual Vacuum Modes for sample analysis – switching between the two modes takes just a few seconds. In Full Vacuum Mode the entire sample chamber is subjected to vacuum conditions to ensure the ultimate sensitivity to light elements. In Partial Vacuum Mode the sample is maintained at atmospheric pressure whilst a vacuum is drawn around the detector and capillary optics. This mode is ideally suited for analysis of water containing samples such as biological tissue, and fragile archaeological/museum objects. 
  • Complete range of sample sizes

    Complete range of sample sizesThe accommodating sample chamber enables a wide range of samples to be analyzed, from a 10 µm spot analysis on a microscopic feature, to mapped analysis of areas as large as 10cm x 10cm. 

  • Integrated Data Acquisition and Analysis Software

    Integrated Data Acquisition and Analysis SoftwareIntuitive software allows easy control of instrument hardware, fast sample visualization and selection of measurement region, and full data analysis. Functions include automated peak identification, quantitative measurements, RGB composite image generation, line profile analysis.

 

Specification

XGT-7200 Specification

Elements: Na to U

X-ray tube: Rh target  / Tube voltage 50kV  / Tube current 1mA 

Fluorescent X-ray detector: Peltier cooled Silicon Drift Detector (SDD)

Transmitted X-ray detector: Nai(Tl) scintilltor

X-ray guide tube: Mono capillary  10μm / 100μm with no filter

Optical image: Full sample optical image and coaxial magnification image

Sample stage size: XY : 100mm×100mm

Sample chamber: Vacuum chamber model/ Max 300mm×300mm×80mm in vacuum

Signal processing: Digital pulse processor ( INCA unit )

Qualitative analysis: Auto identification /  KLM marker /  Peak search / Compare spectrum 

Quantitative analysis: Non standard FPM / Standard FPM / Standard file matching FPM /Calibration curve /   Multi layer FPM (Thickness gage) /Multi point analysis (Max5000) /  Multi point result send to Excel / XGT-5000 spectrum view

Mapping function: Transmitted X-ray image / Elemental image / Spectrum mapping /  Rectangle mapping / Generate spectrum / RGB composition / Scale maker / Line analysis

Other function: Possible to start the XGT-5200 software simultaneously.

Schematics

XGT-7200 Main unit
XGT-7200 Data processing unit

Download Datasheet - XGT-7200__HRE-3925A_

Download Datasheet - XGT-7200_flyer

XGT-5200 X-ray Analytical Microscope

 

Overview

With the unique X-ray Guide Tube the bench top XGT-5200 systems allow convenient access to X-ray fluorescence analysis with high spatial resolution – from 1.2 mm down to 10 µm. There is no sample preparation or vacuum required – the object is simply placed in the sample chamber and analysed at normal atmospheric pressure. Fully integrated software controls sample movement, acquisition options and data analysis (including qualitative and quantitative analysis, and composite image generation). From when a sample is put in the chamber, just a few seconds are needed until an acquisition is started, aided by intuitive “point and click” selection of the analysis position.

The sample is visualised with coaxial geometry, so that parallax errors are removed. You have absolute confidence that where you see is where you sample.

Two X-ray guide tubes are provided in the instrument, allowing the user to simply switch between a micro and macro beams, so that a range of experiments can be accommodated. The high intensity beam delivered by these guide tubes ensures that acquisition times are kept to a minimum. The mono-capillary design of these guide tubes are ideally suited for high intensity element imaging, even of samples which are not perfectly flat.

XRF mapped images are easily obtained through automated sample scanning, and the provision of a second detector beneath the sample enables simultaneous acquisition of X-ray transmission images. The additional structural information provided by this technology is extremely useful for locating regions of interest, or interrogating a sample's internal structure.

Features

  • Highest spatial resolution

    Highest spatial resolutionThe unique x-ray guide tube technology of HORIBA provides the highest spatial resolution micro-XRF analysis, with x-ray beam diameters down to 10 µm. The high intensity, ultra-narrow beams provided by the guide tubes allow fast, non-destructive analysis of microscopic features.

  • Transmission X-ray Mapped Imaging 

    Transmission X-ray Mapped Imaging In combination with XRF imaging, the XGT-5200 allows transmitted X-ray images to be acquired. This can be used to perform internal structural analyses and identify regions of interest not visible to the eye. Scanning is done with a narrow perpendicular beam, resulting in clear penetrating images even for non-flat samples such as cylindrical parts.

  • Complete range of sample sizes

    Complete range of sample sizesThe accommodating sample chamber enables a wide range of samples to be analyzed, from a 10 µm spot analysis on a microscopic feature, to mapped analysis of areas as large as 10cm x 10cm. 


  • Integrated Data Acquisition and Analysis Software

    Integrated Data Acquisition and Analysis SoftwareIntuitive software allows easy control of instrument hardware, fast sample visualization and selection of measurement region, and full data analysis. Functions include automated peak identification, quantitative measurements, RGB composite image generation, line profile analysis.

 

Specifiation

  • XGT System
    High Sensitivity Model (Spatial Resolution: 10 µm, 100 µm)
    TYPE Ⅰ: -

    TYPE Ⅱ: O

    Standard Type (Spatial Resolution: 100 µm)
    TYPE Ⅰ: O (Can be upgraded to 10 µm)

    TYPE Ⅱ: -
  • Transmitted X-ray Detector
    TYPE Ⅰ: O* (Option)
    TYPE Ⅱ: O
    *The transmitted X-ray image window is displayed during mapping even if the X-ray detector is not installed.
  • Optical Image
    Full Sample Optical Image Observation System
    TYPE Ⅰ: O (Option)

    TYPE Ⅱ: O (X2-X16)

    Enlarged Optical Image Coaxial Observation System
    TYPE Ⅰ: O* *(X30)

    TYPE Ⅱ: O (X100)
    ** "100X" when the full sample optical image observation system option is added.

    Measurement Position Setting from the Optical Image
    TYPE Ⅰ: O

    TYPE Ⅱ: O
  • Specifications for All XGT-5200 Models
    X-ray Tube: 50 kV max, 1 mA, Rh target
    Fluorescence X-ray Detector: Peltier cooled Silicon Drift Detector (SDD)
    Elements Detected: Na to U (with sample at normal atmospheric pressure)
    Energy Range: 0 - 40 keV
    Maximum Measurement Area / Maximum Sample Size
    100 mm x 100 mm / 350 mm x 400 mm x 40 mm
    OS: Windows XP

    Software
    Qualitative Analysis Functions
    : Automatic Qualitative Analysis, Multi-Point Analysis, Matching

    Quantitative Analysis Functions
    FPM Quantification(Standardless, 1-point Calibration), Calibration Curve Quantification
    Mapping Analysis: Simultaneous Mapping of the transmitted
    Image and Elemental mapping Image, Pseudo Color, RGB composition, Image Line Analysis, 
    Inter-Image Calculation, Phase Analysis (Option), Contrast Adjustment, 
    Analysis Position Specification from the transmitted Image, 
    Fluorescence Image and Optical ImageCRT Display, Printer Output
    Output: File Output, Data conversion Output (Option), Printing Layout (Option)

    Power Supply: AC100 V/ 50/60 Hz/ 1.3 kVA or less
    Device Weight: 280 kg
    External Dimensions: 2110(W) X 1000(D) X 1350(H) µm
  • Peripherals
    Vacuum Pump · Color Printer · MO Drive (Option) · CD-RW Drive (Option) ·17-in LCD Monitor (Option)· Transmitted Light Illumination System(Option)

Schematics

XGT-5200 Dimensional outline drawing
 
 
 

EX-250/350/450

Overview

EMAX ENERGY combined with SEM is an energy dispersive X-ray analyzer which is suited for foreign material and composition analysis. It matches the samples in many applications.

Analyzer is designed to provide pertinent information concerning qualitative and quantitative analysis. A combination of a high performance detector and easy software provides the many kinds of results (Mapping, Phase analysis, Database search etc).

It also has the process flow navigational function and supports the EMAX users from start to report.

Available in Japan, China, Korea, India, Taiwan, Shingapore, Malaysia, Philippines, Thailand, Indonesia, Vietnam, Pakistan

Features

Software
Navigator and adviser (Bubble Help) function gives manual less operation

Analyzer
Automatic qualitative analysis
Spectra Database –Powerful tool for the unknown element contents

Point & ID
Automatic data collection
When user select the analysis area on the SEM image with 4 modes (Point analysis, Rectangular analysis, Automatic selection, Polygonal region), data collection and data saving can be done automatically.

Spectrum reconstruction
If don’t have the sample, the spectrum can be freely called from the smart map data.

Mapping
Smart Map – Memory of all elements information in mapping area. All element mapping can be displayed after mapping.


Phase Map –Elemental map visualization
Secondary electronic images, Reflection electron microscopic image, Element map image

Cameo plus –Quick color visualization of the distribution for multi elements.Phase Map and Cameo plus carry out phase separation easily.

Specification

Model

EX-250

EX-350

EX-450

Detector 

Type

Standard

Premium

Premium

Detecting element

Si (Li)

Si (Li)

Si (Li)

Resolution/effecture area

137eV, 30mm2

133eV, 30mm2

133eV, 30mm2

Range

B (Z=5) to U (Z=92)

Be (Z=4) to U (Z=92)

Be (Z=4) to U (Z=92)

Analyzer

Computer

OS: Windows XP

Display

Color LCD

Printer

Color Printer

Power supply

AC100/120/200/220/240V, 50/60Hz

Power consumption

600VA (Standard)

Grounding

Installation resistance 100Ω or less

Weight

Approx. 17kg (Analyzing unit and detector)

Capability comparison

Qualitative analysis
(Automatic qualitative analysis and KLM marker)

Spectrum comparison

Quantitative analysis

Line Scan

Smart Map

Automatic data collection (with preselect points areas or features)

-

Cameo plus

-

Spectrum reconstruction

-

Phase map (Phase analysis)

-

-

Spectrum matching

-

-

Spectrum synthesis

-

-

Reporting

Data export
(WordTM, HTML,TIFF etc)

Project file management

Advisor

Navigator

Analyzer

Mapping

Point & ID

 

Schematics

EMAX ENERGY Dimensional outline drawing (mm)

EMAX x-act- Liquid nitrogen less X-ray Detector

 

Overview

Liquid nitrogen less X-ray Detector (Optional type)

EMAX x-act achieved good energy resolution which is unprecedented level in light element using a unique silicon drift sensor (SDD) and combination with the digital pulse processor assure providing accurate results under all conditions.

Available in Japan, China, Korea, India, Taiwan, Shingapore, Malaysia, Philippines, Thailand, Indonesia, Vietnam, Pakistan

Features

  • LN2 less detector - Quick start up
  • Quick analysis - Decreasing mapping time by high counting rate performance
  • High operational stability - Stable performance up to high counting ranges in both qualitative and quantitative analysis
  • All EMAX software functions are available - Navigator, Help function, Quantitative map etc

Specification

Model

EX-250 
x-act

EX-350 
x-act

EX-450 
x-act

Detector

Type

Standard

Premium

Premium

Resolution

135eV

129eV

129eV

Capability comparison

Analyzer

     

Qualitative analysis
(Automatic qualitative analysis and 
KLM marker)

O

O

O

Spectrum comparison

O

O

O

Spectrum overlay

O

O

O

Element catcher

O

O

O

Quantitative analysis

O

O

O

Spectrum matching

Option

Option

O

Spectrum synthesis (Check total)

O

O

O

Mapping

     

Stored entire elemental information 
of SEM image (Smart Map)

O

O

O

Line Scan

O

O

O

Quantitative Map

Option

O

O

Phase analysis (Phase map)

Option

O

O

Distribution analysis of multipul elements 
(Cameo plus)

Option

O

O

Point & ID

     

Automatic data collection of analysis area
/Spectrum reconstruction

O

O

O

Point spectrum (Line & Grid)

Option

O

O

Automatic wide area analysis (Automate)*

Option

Option

O

Wide area mapping (Montage)**

Option

Option

O

Automatic particle analysis (Features)*

Option

Option

O

GSR*

Option

Option

O

Drift correction (Site Lock)

Option

O

O

*: Required auto stage and communication function on the SEM. Please check available SEM model
**: Wide area mapping (Montage) require the "Automatic wide area analysis(Automate)".