The XGT X-ray Fluorescence micro-analyzers combine the fast, non-destructive elemental analysis of energy dispersive X-ray Fluorescence (EDXRF) with the capability to pinpoint individual particles with diameters down to 10 µm in size. Automated sample scanning provides detailed images of element distribution, over areas as large as 10cm x 10cm.
No other technique provides this depth of information with so little fuss. Simply position the sample, and the measurement can begin. Optical and elemental views are seamlessly merged, with the fastest possible acquisition times.
RoHS & ELV Analysers
The worldwide RoHS, WEEE and ELV directives specify strict limits on the inclusion of Lead, Cadmium, Mercury, hexavalent Chromium, poly-brominated biphenyls (PBB) and poly-brominated diphenyl ethers (PBDE) in materials used within consumer electrical goods and automotives.
- RoHS - Restriction of the use of certain Hazardous Substances in electrical and electronic equipment.
- ELV - End of Life Vehicles.
X-ray fluorescence is the technique of choice for fast, non-destructive screening of manufacturing materials and parts. Analysis times are typically in the order of a few minutes for sensitivity to concentrations below 100 ppm (0.01%).
The XGT systems offer limits of detection as low as 2 ppm (0.0002%). A standard 1.2 mm analysis beam allows even small electrical components and parts to be individually analysed.